DocumentCode
3241586
Title
Memory Technology for Extended Large-Scale Integration in Future Electronics Applications
Author
Pamunuwa, Dinesh
Author_Institution
Dept. of Eng., Lancaster Univ., Lancaster
fYear
2008
fDate
10-14 March 2008
Firstpage
1126
Lastpage
1127
Abstract
Extending 2-D planar topologies in integrated circuits (ICs) to a 3-D implementation has the obvious benefits of reducing the overall footprint and average interconnection length, with associated improvements in cost, and delay and energy consumption, while also providing an opportunity to integrate disparate technologies. Such advances are very much technology driven, and early research into 3-D integration has now crystallised into commercially viable options that are being pursued by many companies. Being able to position memory in closer proximity to processing elements in a NoC architecture as afforded by a 3-D physical architecture has the potential to improve the memory bandwidth and mitigate the general nature of delay constrained performance in IC design. Understanding the nature of the opportunities and constraints provided in such a 3-D physical architecture is crucial in realising the true benefits of 3-D integration in future applications.
Keywords
integrated circuit technology; integrated memory circuits; large scale integration; network-on-chip; 2D planar topologies; 3D integrated circuits; 3D physical architecture; IC design; NoC architecture; energy consumption; integrated circuits; large-scale integration; memory technology; Bandwidth; Circuit topology; Costs; Crystallization; Delay; Energy consumption; Integrated circuit interconnections; Integrated circuit technology; Large scale integration; Network-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location
Munich
Print_ISBN
978-3-9810801-3-1
Electronic_ISBN
978-3-9810801-4-8
Type
conf
DOI
10.1109/DATE.2008.4484828
Filename
4484828
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