• DocumentCode
    3243217
  • Title

    Striation Patterns Classification of Tool Marks Based on Extended Fractal Analysis

  • Author

    Min Yang ; Li, Mou ; Li Mou ; Wei-Dong Wang

  • Author_Institution
    Inst. of Forensic Sci., Guangdong Police Coll., Guangzhou
  • fYear
    2008
  • fDate
    22-24 Oct. 2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Currently, optical device, such as microscopes and CCD cameras, are utilized for identification of tool marks in the field of forensic science which mainly depend on the experience of forensic scientists. A new approach using extended fractal analysis technology to classify tool marks such as striation patterns is presented. it computes four directional multi-scale extended fractal parameters and the maximum direction fractal feature, then performs a supervised classification. Experimental results demonstrate that this method provides a classification scheme that performs well than the traditional schemes and is effective for classification of tool marks.
  • Keywords
    feature extraction; image classification; CCD cameras; directional multiscale extended fractal parameters; extended fractal analysis; forensic science; maximum direction fractal feature; microscopes; optical device; striation pattern classification; supervised classification; tool mark classification; tool mark identification; Algorithm design and analysis; Forensics; Fractals; Layout; Optical microscopy; Pattern analysis; Pattern classification; Shape; Surface fitting; Surface topography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2008. CCPR '08. Chinese Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2316-3
  • Type

    conf

  • DOI
    10.1109/CCPR.2008.93
  • Filename
    4663046