DocumentCode
3243217
Title
Striation Patterns Classification of Tool Marks Based on Extended Fractal Analysis
Author
Min Yang ; Li, Mou ; Li Mou ; Wei-Dong Wang
Author_Institution
Inst. of Forensic Sci., Guangdong Police Coll., Guangzhou
fYear
2008
fDate
22-24 Oct. 2008
Firstpage
1
Lastpage
5
Abstract
Currently, optical device, such as microscopes and CCD cameras, are utilized for identification of tool marks in the field of forensic science which mainly depend on the experience of forensic scientists. A new approach using extended fractal analysis technology to classify tool marks such as striation patterns is presented. it computes four directional multi-scale extended fractal parameters and the maximum direction fractal feature, then performs a supervised classification. Experimental results demonstrate that this method provides a classification scheme that performs well than the traditional schemes and is effective for classification of tool marks.
Keywords
feature extraction; image classification; CCD cameras; directional multiscale extended fractal parameters; extended fractal analysis; forensic science; maximum direction fractal feature; microscopes; optical device; striation pattern classification; supervised classification; tool mark classification; tool mark identification; Algorithm design and analysis; Forensics; Fractals; Layout; Optical microscopy; Pattern analysis; Pattern classification; Shape; Surface fitting; Surface topography;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition, 2008. CCPR '08. Chinese Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-2316-3
Type
conf
DOI
10.1109/CCPR.2008.93
Filename
4663046
Link To Document