DocumentCode
324858
Title
Prediction of propagation characteristics using a rigorous UTD formula
Author
Zhang, Y.P. ; Hwang, Y.
Author_Institution
Dept. of Electr. & Electron. Eng., Hong Kong Univ., Hong Kong
Volume
1
fYear
1998
fDate
18-21 May 1998
Firstpage
611
Abstract
A new diffraction coefficient formula rigorous for a two-impedance wall right-angle wedge is presented. The utility of the rigorous formula is demonstrated through its application to predict propagation in a tunnel NLOS microcellular environment
Keywords
cellular radio; electric impedance; geometrical theory of diffraction; land mobile radio; radiowave propagation; 1800 MHz; UHF; diffraction coefficient formula; propagation characteristics prediction; radiowave propagation; rigorous UTD formula; tunnel NLOS microcellular environment; two-impedance wall right-angle wedge; Electromagnetic diffraction; Electromagnetic propagation; Geometrical optics; Impedance; Material properties; Optical propagation; Optical reflection; Physical theory of diffraction; Ray tracing; Tellurium;
fLanguage
English
Publisher
ieee
Conference_Titel
Vehicular Technology Conference, 1998. VTC 98. 48th IEEE
Conference_Location
Ottawa, Ont.
ISSN
1090-3038
Print_ISBN
0-7803-4320-4
Type
conf
DOI
10.1109/VETEC.1998.686647
Filename
686647
Link To Document