• DocumentCode
    3248952
  • Title

    Mutual information without channel knowledge at the receiver

  • Author

    Medles, Abdelkader ; Slock, Dirk T M

  • Author_Institution
    Eurecom Inst., Sophia Antipolis, France
  • fYear
    2003
  • fDate
    15-18 June 2003
  • Firstpage
    398
  • Lastpage
    402
  • Abstract
    In this paper, we analyze the semiblind mutual information (MI) between the input and output of a MIMO channel. To that end we consider the popular block fading model. We assume that some training/pilot symbols get inserted at the beginning of each burst. We show that the average MI over a transmission burst can be decomposed into symbol position dependent contributions. The MI component at a certain symbol position optimally combines semiblind information up to that symbol position (with perfect input recovery up to that position) with blind information from the rest of the burst. We also analyze the asymptotic regime for which we can formulate optimal channel estimates and evaluate the capacity loss with respect to the known channel case. Asymptotically, the decrease in MI involves Fisher information matrices for certain channel estimation problems. We also suggest to exploit correlations in the channel model to improve estimation performance and minimize capacity loss.
  • Keywords
    MIMO systems; channel capacity; channel estimation; fading channels; Fisher information matrices; MI; MIMO channel; asymptotic regime; block fading model; capacity loss; channel estimation; channel model correlations; estimation performance; fading channels; input recovery; semiblind mutual information; symbol position dependent contributions; training/pilot symbols; transmission burst; Antenna arrays; Cathode ray tubes; Channel estimation; Communication industry; Fading; Information analysis; MIMO; Mutual information; Performance loss; Transmitters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing Advances in Wireless Communications, 2003. SPAWC 2003. 4th IEEE Workshop on
  • Print_ISBN
    0-7803-7858-X
  • Type

    conf

  • DOI
    10.1109/SPAWC.2003.1318990
  • Filename
    1318990