• DocumentCode
    3249384
  • Title

    Evaluation of wire bond integrity through force detected wire vibration analysis

  • Author

    Luo, H. ; Lu, Z. ; Nam, J.H. ; Chen, P. C Y ; Lin, W.

  • Author_Institution
    Mechatron. Group, Singapore Inst. of Manuf. Technol., Singapore, Singapore
  • fYear
    2009
  • fDate
    14-17 July 2009
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper studies the feasibility of using force measurement to detect wire vibration for the evaluation of wire bond integrity. In this system, a tapping probe sends a single pulse or multiple pulses of controlled motion to the substrate adjacent to a bond end. This mechanical shock induces vibration propagation to the wire along and through the neighbouring materials. Another probe of a micro force sensor is put in touch with the wire to pick up the wire vibration, which in turn, correlates to the bonding status of the joined materials. By interpreting the vibration signals in time, frequency, and phase domains, bond integrity, including fully bonded, partially bonded, and touching yet not-bonded, has been determined. The results show that the proposed approach is promising for finer and denser wire bond evaluation non-destructively, accurately, and at low cost.
  • Keywords
    electronics packaging; force measurement; force sensors; lead bonding; microsensors; nondestructive testing; probes; vibrations; electronics packaging industry; force detected wire vibration analysis; force measurement; mechanical shock; microforce sensor; nondestructive evaluation; probes; vibration propagation; wire bond integrity evaluation; wire bonding technology; Bonding forces; Control systems; Electric shock; Force measurement; Force sensors; Joining materials; Motion control; Probes; Vibration measurement; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Intelligent Mechatronics, 2009. AIM 2009. IEEE/ASME International Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-2852-6
  • Type

    conf

  • DOI
    10.1109/AIM.2009.5230047
  • Filename
    5230047