• DocumentCode
    3250269
  • Title

    Macromodel for micromechanical, multi-electrode structures in force feedback control systems

  • Author

    Handtmann, M. ; Aigner, R. ; Plotz, F. ; Wachutka, G.

  • Author_Institution
    Infineon Corp. Res., Munich, Germany
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    183
  • Lastpage
    186
  • Abstract
    Electrostatic force feedback loops are commonly used for measurement and position control in micromechanical sensors and actuators. They are widely implemented with switched capacitor, sigma-delta (Σ/Δ) architectures as they provide perfect compatibility with capacitive sensing methods. The electromechanical subsystem, as a vital part of a Σ/Δ-loop, strongly influences the loop characteristics. In order to characterize a Σ/Δ-loop, however, transient simulations over a long time period are inevitable. Full 3D physical simulations (FEM/BEM) at system level are numerically impractical. Therefore, effective macromodels of the electro-mechanical subsystem are required. Established macromodels can handle one-dimensional systems and weakly coupled multi-dimensional systems but are not applicable to multidimensional, multi-electrode systems. A novel modeling technique is presented for micromechanical, multi-electrode structures which is based on Lagrange´s equations. It considers the coupling of the structure kinematics with the electrical field between the electrodes. It further reflects parasitic excitation of the mechanical fundamental eigenmodes of the structure. The technique is applied to a new electrostatic levitation system controlling a micromechanical plate
  • Keywords
    capacitive sensors; electrostatic actuators; finite element analysis; force feedback; kinematics; microelectrodes; microsensors; position control; position measurement; semiconductor device models; sigma-delta modulation; Lagrange´s equations; capacitive sensing; electrical field coupling; electrostatic force feedback loops; electrostatic levitation system; finite element analysis; force feedback control systems; macromodel; mechanical fundamental eigenmodes; micromechanical actuators; micromechanical multielectrode structures; micromechanical plate; micromechanical sensors; parasitic excitation; position control; position measurement; structure kinematics; switched capacitor sigma-delta architectures; Electromechanical sensors; Electrostatic measurements; Force feedback; Force measurement; Force sensors; Micromechanical devices; Multidimensional systems; Position control; Position measurement; Sensor phenomena and characterization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices, 1999. SISPAD '99. 1999 International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    4-930813-98-0
  • Type

    conf

  • DOI
    10.1109/SISPAD.1999.799291
  • Filename
    799291