• DocumentCode
    3251841
  • Title

    Pulsed laser evaluation of single event transients in optocouplers

  • Author

    Yingqi, Ma ; Guoqiang, Feng ; Jianwei, Han

  • Author_Institution
    CSSAR, GUCAS, Beijing, China
  • fYear
    2009
  • fDate
    23-26 Jan. 2009
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    A methodology which used pulsed laser to evaluate the Single Event Transients (SETs) in the optocouplers was proposed. The SETs responses of the optocouplers were firstly investigated with the experimental simulation by pulsed laser test facility. The pulsed laser test data was compared with the ion test data to indicate the veracity and to provide insights into the SETs mechanism. The SETs characters induced by pulsed laser were qualitatively analyzed in model theory.
  • Keywords
    opto-isolators; radiation effects; experimental simulation; optocouplers; pulsed laser evaluation; pulsed laser test data; pulsed laser test facility; single event transients; Laser modes; Laser theory; Microelectronics; Optical pulse generation; Optical pulses; Semiconductor devices; Semiconductor laser arrays; Semiconductor lasers; Test facilities; Testing; Optocouplers; Pulsed laser evaluation; Single Event Effects; Single event transients;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2009 - 2009 IEEE Region 10 Conference
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-4546-2
  • Electronic_ISBN
    978-1-4244-4547-9
  • Type

    conf

  • DOI
    10.1109/TENCON.2009.5395844
  • Filename
    5395844