Electron microscopy analysis of amorphous and crystalline diamond coated silicon field emitters

The present paper concentrates on the morphology and microstructure of the coatings, as determined from electron microscopy investigations of coated Si emitters. The microscopy techniques used in this study include scanning electron microscopy to examine the macroscopic diamond morphology; high resolution TEM to study both detailed morphology and interface structure; selected area electron diffraction to determine if the film is crystalline or amorphous and to identify the coating species; and electron energy loss spectroscopy to determine the nature of the carbon bonding-sp/sup 3/, sp/sup 2/, or amorphous-in the film.