DocumentCode
3252831
Title
A Reliability Study of RFID Technology in a Fading Channel
Author
Su, Weilian ; Beilke, Kyle M. ; Ha, Tri T.
Author_Institution
Naval Postgrad. Sch., Monterey
fYear
2007
fDate
4-7 Nov. 2007
Firstpage
2124
Lastpage
2127
Abstract
RFID systems are an important component in the effort to increase the efficiencies of the logistics supply chain for the U.S. Department of Defense. While the U.S. DoD has mandated the use of RFID tags for its suppliers, the technology has not always kept up with the performance expectations. This study explores new modulation and coding techniques to possibly be used in the improvement of the read reliability of RFID systems. Bit and tag error probabilities are computed for OOK modulation scheme in a varying Nakagami-m fading channel.
Keywords
fading channels; modulation coding; radiofrequency identification; RFID Technology; coding techniques; fading channel; logistics supply chain; modulation techniques; reliability study; Batteries; Costs; Equations; Fading; Logistics; Modulation coding; RFID tags; Radio transmitters; Radiofrequency identification; Supply chains;
fLanguage
English
Publisher
ieee
Conference_Titel
Signals, Systems and Computers, 2007. ACSSC 2007. Conference Record of the Forty-First Asilomar Conference on
Conference_Location
Pacific Grove, CA
ISSN
1058-6393
Print_ISBN
978-1-4244-2109-1
Electronic_ISBN
1058-6393
Type
conf
DOI
10.1109/ACSSC.2007.4487614
Filename
4487614
Link To Document