DocumentCode
3252875
Title
Electromigration instability of cylindrical surface microrelief
Author
Fedirko, V.A. ; Eremchenko, D.V.
Author_Institution
State Univ. of Technol., Moscow, Russia
fYear
1995
fDate
July 30 1995-Aug. 3 1995
Firstpage
443
Lastpage
446
Abstract
Instability of cylindrical conducting surface microrelief fluctuations is investigated by means of small perturbation analysis using Herring chemical potential. Unstable wave-vector domain is found and effects of microtips build up and modification are discussed from the unstable modes increments viewpoint.
Keywords
chemical potential; electromigration; perturbation theory; surface diffusion; surface topography; Herring chemical potential; cylindrical conducting surface microrelief fluctuations; electromigration instability; microtips; perturbation analysis; unstable modes; wave vectors; Chemical analysis; Chemical technology; Current density; Electromigration; Electrostatics; Equations; Fluctuations; Stability; Surface tension; Surface waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
Conference_Location
Portland, OR, USA
Print_ISBN
0-7803-2143-X
Type
conf
DOI
10.1109/IVMC.1995.487085
Filename
487085
Link To Document