Improved Bisection Searching Technique for voltage collapse analysis in reliability evaluation

This paper proposes an Improved Bisection Searching Technique (IBSST) for voltage collapse analysis in reliability evaluation. The loading factor which is the closest to the voltage collapse point for a contingency state can be determined using the proposed technique. The IEEE 30-Bus System has been analyzed using both the IBSST and the Binomial Searching Technique (BNST). The expected system loading factor considering up to first order line contingencies has been defined and calculated to represent the effect of system configurations. Load point reliability in terms of voltage stability is presented by the probability of a bus being the weakest bus considering the first order failures. The computation time of the IBSST is three times faster than that of the BNST. The more accurate loading factors can be obtained using the IBSST compared with the BNST.