DocumentCode
3254116
Title
A survey on defect and noise detection and correction algorithms in image sensors
Author
Jain, Abhishek ; Gupta, Richa
Author_Institution
ECE Dept., Jaypee Inst. of Inf. Technol., Noida, India
fYear
2015
fDate
19-20 March 2015
Firstpage
754
Lastpage
759
Abstract
This paper presents a survey on various novel defect and noise detection and correction algorithms used in CMOS image sensors. This class of sensors is extremely relevant in number of applications in the areas of gaming, security, medical, automotive, high-end camera market, etc. This survey outlines the algorithms and the hardware implementation of novel defect and noise detection and correction schemes to detect and correct defective pixels, and discusses their performance and advantages in terms of their applications. Experimental results on various images illustrate the capabilities of the studied approaches.
Keywords
CMOS image sensors; fault diagnosis; image denoising; CMOS image sensor; correction algorithm; defect detection; defective pixel correction; hardware implementation; noise detection; Algorithm design and analysis; Image sensors; Kernel; Noise; Sensors; Shape; Signal processing algorithms; Image sensors; defect correction; defect detection; noise reduction;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Engineering and Applications (ICACEA), 2015 International Conference on Advances in
Conference_Location
Ghaziabad
Type
conf
DOI
10.1109/ICACEA.2015.7164803
Filename
7164803
Link To Document