• DocumentCode
    3254116
  • Title

    A survey on defect and noise detection and correction algorithms in image sensors

  • Author

    Jain, Abhishek ; Gupta, Richa

  • Author_Institution
    ECE Dept., Jaypee Inst. of Inf. Technol., Noida, India
  • fYear
    2015
  • fDate
    19-20 March 2015
  • Firstpage
    754
  • Lastpage
    759
  • Abstract
    This paper presents a survey on various novel defect and noise detection and correction algorithms used in CMOS image sensors. This class of sensors is extremely relevant in number of applications in the areas of gaming, security, medical, automotive, high-end camera market, etc. This survey outlines the algorithms and the hardware implementation of novel defect and noise detection and correction schemes to detect and correct defective pixels, and discusses their performance and advantages in terms of their applications. Experimental results on various images illustrate the capabilities of the studied approaches.
  • Keywords
    CMOS image sensors; fault diagnosis; image denoising; CMOS image sensor; correction algorithm; defect detection; defective pixel correction; hardware implementation; noise detection; Algorithm design and analysis; Image sensors; Kernel; Noise; Sensors; Shape; Signal processing algorithms; Image sensors; defect correction; defect detection; noise reduction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Engineering and Applications (ICACEA), 2015 International Conference on Advances in
  • Conference_Location
    Ghaziabad
  • Type

    conf

  • DOI
    10.1109/ICACEA.2015.7164803
  • Filename
    7164803