DocumentCode
3254168
Title
An On-Chip Measurement Circuit for Calibration by Combination Selection
Author
Maunu, Janne ; Marku, Joona ; Laiho, Mika ; Paasio, Ari
Author_Institution
Dept. of Inf. Technol., Univ. of Turku, Turku
fYear
2006
fDate
24-27 Sept. 2006
Firstpage
63
Lastpage
64
Abstract
We present an on-chip measurement circuit for current source calibration by combination selection in current and future CMOS technologies. The circuit evaluates the output current values and selects a current that ensures 99% mismatch compensation accuracy with 4 sigma yield.
Keywords
CMOS integrated circuits; calibration; electric current measurement; integrated circuit measurement; CMOS technologies; combination selection; current source calibration; mismatch compensation accuracy; on-chip current measurement circuit; CMOS technology; Calibration; Computer science; Counting circuits; Current measurement; Information technology; Laboratories; Microelectronics; Mirrors; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
SOC Conference, 2006 IEEE International
Conference_Location
Taipei
Print_ISBN
0-7803-9781-9
Electronic_ISBN
0-7803-9782-7
Type
conf
DOI
10.1109/SOCC.2006.283844
Filename
4063013
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