Electrical conduction characteristics of VLDPE and LLDPE degraded by the voltage-thermal stress

Author

Yi, Dong-Young ; Hwangbo, Seung ; Han, Min-Koo

Author_Institution

EESRI, Seoul Nat. Univ., South Korea

fYear

1995

fDate

10-13 Jul 1995

Firstpage

462

Lastpage

466

Abstract

The effects of voltage-thermal stress on the conduction behaviors of VLDPE and LLDPE have been investigated. It is observed that the conduction current density of the voltage-thermal aged VLDPE decreases while the conduction current of aged LLDPE increases significantly. We could conclude that the decrease of conduction current in the aged VLDPE may be attributed to the slight increase of activation energy and decrease of hopping distance, and the large decrease of activation energy (~0.2 [eV]) together with electrode effect were responsible for the increase of conduction current in the aged LLDPE. We could confirm, from the XRD analysis, that the changes of conduction behaviors in aged VLDPE and LLDPE may be due to the decrease of deep traps or defects in the ordered phase of aged LLDPE and increase of traps between crystalline-amorphous boundaries of VLDPE respectively

Keywords

ageing; current density; deep levels; electrical conductivity; electron traps; polyethylene insulation; polymer films; LLDPE; VLDPE; XRD analysis; activation energy; ageing; conduction current density; crystalline-amorphous boundaries; deep traps; defects; degradation; electrical conduction characteristics; electrode effect; hopping distance; voltage-thermal stress; Aging; Current density; Current measurement; Degradation; Dielectrics and electrical insulation; Electrodes; Performance analysis; Steady-state; Stress; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Conduction and Breakdown in Solid Dielectrics, 1995. ICSD'95., Proceedings of the 1995 IEEE 5th International Conference on

Conference_Location

Leicester

Print_ISBN

0-7803-2040-9

Type

conf

DOI

10.1109/ICSD.1995.523029

Filename

523029