• DocumentCode
    3257477
  • Title

    The relationship between molecular structure and field effect mobility in organic semiconductors

  • Author

    Locklin, Jason

  • Author_Institution
    Dept. of Chem. & Fac. of Eng., Univ. of Georgia, Athens, GA
  • fYear
    2008
  • fDate
    7-11 Sept. 2008
  • Firstpage
    349
  • Lastpage
    351
  • Abstract
    Short conjugated phenylene-thiophene oligomers with varying alpha and omega alkyl and alkoxy substitutions were synthesized to investigate the correlation between end-group structure and electronic properties on P2TP and P3TP conjugated cores. Several oligomers had high solubility and field-effect mobility, with 5,5´-Bis(4-n-octylphenyl)-2,2´ -bithiophene showing the highest mobility (mu = 0.18 cm2/Vmiddots) and on/off ratio of 107. Thin film morphologies analyzed using atomic force microscopy revealed higher nucleation densities for branched alkoxy side chain molecules compared to their straight alkyl side chain counterparts. Field effect mobility showed an inverse correlation to side-chain bulkiness, indicating a strong morphological component to charge transport. Novel methods of solution processing involving alignment under shear and the demonstration of these materials in low voltage aqueous sensors are highlighted.
  • Keywords
    atomic force microscopy; conducting polymers; molecular electronics; nucleation; organic field effect transistors; organic semiconductors; semiconductor thin films; 5,5´-Bis(4-n-octylphenyl)-2,2´ -bithiophene; P2TP conjugated cores; P3TP conjugated cores; alkoxy substitutions; alpha alkyl; atomic force microscopy; branched alkoxy side chain molecules; charge transport; electronic property; end-group structure; field effect mobility; molecular structure; nucleation density; omega alkyl; organic semiconductors; short conjugated phenylene-thiophene oligomers; side-chain bulkiness; solubility; thin film morphology; voltage aqueous sensors; Atomic force microscopy; Dielectric thin films; Microstructure; Morphology; OFETs; Organic semiconductors; Semiconductor materials; Semiconductor thin films; Spine; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulating Materials, 2008. (ISEIM 2008). International Symposium on
  • Conference_Location
    Mie
  • Print_ISBN
    978-4-88686-005-7
  • Electronic_ISBN
    978-4-88686-006-4
  • Type

    conf

  • DOI
    10.1109/ISEIM.2008.4664452
  • Filename
    4664452