Error propagation with different VNA calibration techniques at millimeter frequencies

Author

Shoaib, Nosherwan ; Sellone, M. ; Ferrero, Alessandro ; Oberto, L. ; Brunetti, L.

Author_Institution

Electromagn. Div., Ist. Naz. di Ricerca Metrol. - INRIM, Turin, Italy

fYear

2013

fDate

18-21 Nov. 2013

Firstpage

1

Lastpage

3

Abstract

This paper describes the scattering parameters magnitude measurement and uncertainty comparison using different vector network analyzer (VNA) calibration algorithms at millimeter frequencies with WR10 (75 to 110 GHz) waveguides. The state of the art two port calibration algorithms Thru-Reflect-Line (TRL) and Quick Short-Open-Load-Thru (QSOLT) are considered in this comparison. The dimensional measurements for Shim WR10 are also carried out.

Keywords

calibration; measurement uncertainty; millimetre wave measurement; network analysers; Shim WR10; VNA calibration techniques; WR10 waveguides; error propagation; frequency 75 GHz to 110 GHz; magnitude measurement; millimeter frequencies; quick short-open-load-thru; thru-reflect-line; two port calibration algorithms; uncertainty comparison; vector network analyzer calibration algorithms; Calibration; Frequency measurement; Measurement uncertainty; Ports (Computers); Scattering parameters; Standards; Uncertainty; Measurement uncertainty evaluation; scattering parameters; two port network analyzers; vector network analyzer calibration; waveguide;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Measurement Conference, 2013 82nd ARFTG

Conference_Location

Columbus, OH

Type

conf

DOI

10.1109/ARFTG-2.2013.6737351

Filename

6737351