Electron microscopy of water trees in XLPE

Author

Olley, R.H. ; Vaughan, A.S. ; Bassett, D.C. ; Moody, S.M. ; Banks, V.A.A.

Author_Institution

J.J. Thomson Phys. Lab., Reading Univ., UK

fYear

1995

fDate

10-13 Jul 1995

Firstpage

676

Lastpage

680

Abstract

The authors report results obtained using a novel technique developed by Olley et al., which is equally applicable to the low resolution (~1 μm) optical examination of water trees; detailed studies of tree microstructure in the scanning electron microscope (SEM) and also to high resolution imaging in the transmission electron microscope (TEM). Specifically, this paper sets out to illustrate the range of water tree structures observed in medium voltage cable insulation, and to describe how these are organised internally

Keywords

XLPE insulation; electron microscopy; insulation testing; power cable insulation; scanning electron microscopy; transmission electron microscopy; trees (electrical); SEM; TEM; XLPE; electron microscopy; high resolution imaging; medium voltage cable insulation; scanning electron microscopy; transmission electron microscopy; tree microstructure; water tree structures; water trees; Electron microscopy; Electron optics; High-resolution imaging; Image resolution; Medium voltage; Microstructure; Optical microscopy; Scanning electron microscopy; Transmission electron microscopy; Trees - insulation;

fLanguage

English

Publisher

ieee

Conference_Titel

Conduction and Breakdown in Solid Dielectrics, 1995. ICSD'95., Proceedings of the 1995 IEEE 5th International Conference on

Conference_Location

Leicester

Print_ISBN

0-7803-2040-9

Type

conf

DOI

10.1109/ICSD.1995.523072

Filename

523072