DocumentCode
3261049
Title
Delay variation tolerance for domino circuits
Author
Wu, Kai-Chiang ; Hsieh, Cheng-Tao ; Chang, Shih-Chieh
Author_Institution
Dept. of CS, Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear
2006
fDate
24-27 Jan. 2006
Abstract
Factors of delay variation, such as process variation and noise effects, may cause a manufactured chip to violate the pre-specified timing constraint. In this paper, we propose a re-synthesis technique to tolerate delay variation for domino circuits. Note that the slacks of nodes along critical paths are zero; any delay addition to those zero-slack nodes worsens the final performance of a circuit. Our basic idea is to increase the slacks of nodes in the critical region by appending a redundant auxiliary subcircuit to the original circuit. The auxiliary subcircuit can cause critical paths to become false paths or imperceptible paths as stated in S. Raj et al. (2004) so as to improve the capability of delay variation tolerance. Experimental results are very encouraging.
Keywords
delays; fault tolerance; logic circuits; logic design; auxiliary subcircuit; critical paths; delay variation tolerance; domino circuits; false paths; imperceptible paths; noise effects; process variation; re-synthesis technique; timing constraint; zero-slack nodes; Added delay; Circuit noise; Delay effects; Feeds; Logic functions; Manufacturing processes; Redundancy; Timing; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 2006. Asia and South Pacific Conference on
Print_ISBN
0-7803-9451-8
Type
conf
DOI
10.1109/ASPDAC.2006.1594708
Filename
1594708
Link To Document