• DocumentCode
    3261049
  • Title

    Delay variation tolerance for domino circuits

  • Author

    Wu, Kai-Chiang ; Hsieh, Cheng-Tao ; Chang, Shih-Chieh

  • Author_Institution
    Dept. of CS, Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • fYear
    2006
  • fDate
    24-27 Jan. 2006
  • Abstract
    Factors of delay variation, such as process variation and noise effects, may cause a manufactured chip to violate the pre-specified timing constraint. In this paper, we propose a re-synthesis technique to tolerate delay variation for domino circuits. Note that the slacks of nodes along critical paths are zero; any delay addition to those zero-slack nodes worsens the final performance of a circuit. Our basic idea is to increase the slacks of nodes in the critical region by appending a redundant auxiliary subcircuit to the original circuit. The auxiliary subcircuit can cause critical paths to become false paths or imperceptible paths as stated in S. Raj et al. (2004) so as to improve the capability of delay variation tolerance. Experimental results are very encouraging.
  • Keywords
    delays; fault tolerance; logic circuits; logic design; auxiliary subcircuit; critical paths; delay variation tolerance; domino circuits; false paths; imperceptible paths; noise effects; process variation; re-synthesis technique; timing constraint; zero-slack nodes; Added delay; Circuit noise; Delay effects; Feeds; Logic functions; Manufacturing processes; Redundancy; Timing; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 2006. Asia and South Pacific Conference on
  • Print_ISBN
    0-7803-9451-8
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2006.1594708
  • Filename
    1594708