• DocumentCode
    3261096
  • Title

    IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults

  • Author

    Li, Katherine Shu-Min ; Chang, Yao-Wen ; Su, Chauchin ; Lee, Chung-Len ; Chen, Jwu E.

  • Author_Institution
    Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2006
  • fDate
    24-27 Jan. 2006
  • Abstract
    We propose an interconnect diagnosis scheme based on oscillation ring test methodology for SOC design with heterogeneous cores. The target fault models are delay faults and crosstalk glitches. We analyze the diagnosability of an interconnect structure and propose a fast diagnosability checking algorithm and an efficient diagnosis ring generation algorithm which achieves the optimal diagnosability. Two optimization techniques improve the efficiency and effectiveness of interconnect diagnosis. In all experiments, our method achieves 100% fault coverage and the optimal diagnosis resolution.
  • Keywords
    crosstalk; delays; fault diagnosis; integrated circuit interconnections; integrated circuit testing; system-on-chip; IEEE standard 1500; SOC design; crosstalk faults; crosstalk glitches; delay faults; diagnosis ring generation; fast diagnosability checking; fault models; interconnect diagnosis; optimal diagnosability; optimal diagnosis; oscillation ring test; Algorithm design and analysis; Circuit faults; Circuit testing; Crosstalk; Delay; Design engineering; Electrical fault detection; Electronic equipment testing; Fault diagnosis; Integrated circuit interconnections;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 2006. Asia and South Pacific Conference on
  • Print_ISBN
    0-7803-9451-8
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2006.1594710
  • Filename
    1594710