Proceedings. 10th IEEE International On-Line Testing Symposium

fYear

2004

fDate

14-14 July 2004

Abstract

The following topics are dealt with: timing and transient faults; self testing and self checking circuits; checker and voter design; concurrent error detection; emerging field reliability and dependability challenges; microprocessor on-line testing; on-line testing evaluation; error correcting code based fault tolerance; reconfiguration, repair, and reuse for fault tolerance; built in self test; safety and security; dependability evaluation; reliability implications of statistical design.

Keywords

automatic testing; built-in self test; circuit testing; error correction codes; error detection; fault tolerance; integrated circuit testing; logic testing; reconfigurable architectures; reliability; safety; security; timing; transients; built in self test; checker design; concurrent error detection; dependability evaluation; error correcting codes; fault tolerance; field dependability; field reliability; microprocessor on-line testing; on-line testing; on-line testing evaluation; reconfiguration; repair; reuse; safety; security; self checking circuits; self testing circuits; statistical design reliability; timing faults; transient faults; voter design;

fLanguage

English

Publisher

ieee

Conference_Titel

On-Line Testing Symposium, 2004. IOLTS 2004. Proceedings. 10th IEEE International

Conference_Location

Funchal, Madeira Island, Portugal

Print_ISBN

0-7695-2180-0

Type

conf

DOI

10.1109/OLT.2004.1319645

Filename

1319645