DocumentCode
3261331
Title
Functional versus random test generation for controllers and finite state machines
Author
Karam, M. ; Saucier, G.
Author_Institution
Inst. Nat. Polytech. de Grenoble, France
fYear
1992
fDate
1-5 Jun 1992
Firstpage
207
Lastpage
212
Abstract
The authors present a functional test generation method for finite state machines based on state graph traversal and evaluates its efficiency by comparing it to random test generation and other methods on a set of benchmarks
Keywords
finite state machines; logic testing; benchmarks; controllers; finite state machines; random test generation; state graph traversal; test generation; Automata; Benchmark testing; Fault detection; Microprocessors; Optimization methods; Performance evaluation; Phase detection; Silicon compiler; Switches; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Euro ASIC '92, Proceedings.
Conference_Location
Paris
Print_ISBN
0-8186-2845-6
Type
conf
DOI
10.1109/EUASIC.1992.228023
Filename
228023
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