• DocumentCode
    3263583
  • Title

    Status And Trends In SOI CMOS Technology

  • Author

    Colinge, Jean-Pierre

  • fYear
    1997
  • fDate
    3-5 June 1997
  • Firstpage
    118
  • Lastpage
    122
  • Keywords
    CMOS technology; Coupling circuits; Laboratories; Low voltage; MOSFETs; Microelectronics; Microwave frequencies; Parasitic capacitance; Random access memory; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, Systems, and Applications, 1997. Proceedings of Technical Papers. 1997 International Symposium on
  • Conference_Location
    Taipei, Taiwan
  • ISSN
    1524-766X
  • Print_ISBN
    0-7803-4131-7
  • Type

    conf

  • DOI
    10.1109/VTSA.1997.614741
  • Filename
    614741
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3263583