DocumentCode

3265261

Title

Enhanced Hot Carrier Effects In Scaled Flash Memory Devices

Author

Chen, C. ; Liu, Z. ; Ma, T.P.

fYear

1997

fDate

3-5 June 1997

Firstpage

162

Lastpage

166

Keywords

Charge measurement; Charge pumps; Current measurement; EPROM; Flash memory; Hot carrier effects; Hot carriers; Microelectronics; Stress; Threshold voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Technology, Systems, and Applications, 1997. Proceedings of Technical Papers. 1997 International Symposium on

Conference_Location

Taipei, Taiwan

ISSN

1524-766X

Print_ISBN

0-7803-4131-7

Type

conf

DOI

10.1109/VTSA.1997.614750

Filename

614750