• DocumentCode
    3265790
  • Title

    Migration of legacy test programs to a modern computer platform [for avionics testing]

  • Author

    Lerew, Elvin W.

  • Author_Institution
    Boeing Co., Seattle, WA, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    293
  • Lastpage
    298
  • Abstract
    Boeing, like many companies, was faced with solving test station obsolescence to preserve the investment of over two hundred fifty test programs for in-house manufacturing as well as airline customer support. Boeing needed to update the computer on a 1980s vintage Hewlett-Packard (HP) 1000 computer-based ATE. A SUN SPARC Ultra 30 computer was selected to replace this out of production HP computer. The increased processing speed that was provided by this newer computer had the potential to impact the investment of test programs. A goal was established to not change the test programs or to at least minimize the required changes due to the potential cost. Preserving these test programs written in BASIC, FORTRAN and ATLAS 616 was a significant technical challenge. This paper discusses the innovations and ultimate solutions to minimizing test program changes required by the computer upgrade. It discusses timing issues created by the upgrade and how a balance was made between keeping TPS changes to a minimum while taking advantage of the increased processing speed in compiling and executing the test programs. It also addresses some of the enhancements requiring test software modifications that were determined to add significant value to the automated test system
  • Keywords
    automatic test equipment; automatic test software; avionics; software tools; SUN SPARC Ultra 30 computer; avionics testing; computer upgrade; computer-based ATE; increased processing speed; legacy test program migration; minimized test program changes; modern computer platform; test procedure verification; test program investment; test software modifications; test station obsolescence; timing issues; Automatic testing; Costs; Investments; Manufacturing; Production; Software testing; Sun; System testing; Technological innovation; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
  • Conference_Location
    San Antonio, TX
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-5432-X
  • Type

    conf

  • DOI
    10.1109/AUTEST.1999.800393
  • Filename
    800393