• DocumentCode
    3266568
  • Title

    PXI and VXI modular instrumentation in the new millennium

  • Author

    Puls, Carsten

  • Author_Institution
    Nat. Instrum. Corp., Austin, TX, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    623
  • Lastpage
    625
  • Abstract
    Instrumentation has evolved in many ways over the past several decades. Standards such as GPIB and VXI made open, multi-vendor test systems possible and personal computer technology stretched overall capabilities and ease-of-use. Test technology for the new millennium now includes CompactPCI with PXI extensions. PXI directly couples PC technology with traditional instrument capabilities found in VXI to result in broader measurement and automation capabilities. Advanced measurement technology combined with the fast processing capabilities of today´s PCs result in performance gains of more than 10X when comparing PXI to older architectures. As PXI continues to grow, it is important to understand its relationship to VXI. A solid understanding of both architectures will help test engineers in the new millennium to properly configure systems using PXI, VXI, or both
  • Keywords
    automatic test equipment; peripheral interfaces; virtual instrumentation; CompactPCI; MXI modular instrumentation; PXI extensions; VXI modular instrumentation; advanced measurement technology; fast processing capabilities; integrating multiple platforms; interoperability; software extensions; test technology; Automation; Clocks; Computer aided manufacturing; Computer architecture; Electrical products industry; Gain measurement; Instruments; Manufacturing industries; Microcomputers; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
  • Conference_Location
    San Antonio, TX
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-5432-X
  • Type

    conf

  • DOI
    10.1109/AUTEST.1999.800437
  • Filename
    800437