DocumentCode
3268781
Title
Fundamental concepts of power and energy measurement with the computer-aided-design tools
Author
Kumar, Ranjith ; Liu, Zhiyu ; Kursun, Volkan
Author_Institution
Univ. of Wisconsin - Madison, Madison
fYear
2007
fDate
5-8 Aug. 2007
Firstpage
863
Lastpage
866
Abstract
Computer-aided design (CAD) tools are frequently employed to verify the design objectives before the fabrication of an integrated circuit. Circuit simulators typically provide built-in functions to measure the power consumption. However, the accuracy of the measured power is mostly overlooked since the approximations and the methodology used by the existing built-in power estimation tools are not well documented. A blind-trust in the CAD tools may lead to gross errors in the power estimation. A generic methodology to accurately measure the power and energy consumption with circuit simulators is described in this paper. An equation to calculate the device power consumption based on the different current conduction paths in a MOSFET is presented. An expression for the total power consumption of a complex circuit is also derived by explicitly considering the different circuit terminals including the inputs, the outputs, and the body-contacts. Results indicate that the built-in functions of commercial circuit simulators can produce significant power measurement errors in a 65 nm CMOS technology. For deeply scaled nano-CMOS circuits producing significant leakage, a conscious power measurement with the proposed explicit methodology is recommended for an accurate pre-fabrication circuit characterization.
Keywords
CMOS integrated circuits; MOSFET; circuit simulation; electronic design automation; energy measurement; power measurement; CMOS circuits; MOSFET; circuit simulation; computer-aided-design tools; energy measurement; integrated circuit fabrication; power estimation; power measurement; CMOS technology; Circuit simulation; Computational modeling; Design automation; Differential equations; Energy consumption; Energy measurement; Fabrication; Integrated circuit measurements; Power measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2007. MWSCAS 2007. 50th Midwest Symposium on
Conference_Location
Montreal, Que.
ISSN
1548-3746
Print_ISBN
978-1-4244-1175-7
Electronic_ISBN
1548-3746
Type
conf
DOI
10.1109/MWSCAS.2007.4488709
Filename
4488709
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