• DocumentCode
    3271297
  • Title

    Electronic and structural characteristics of atomic diffusion in Fe/Al [001] and Al/Fe [001] systems

  • Author

    Kim, Chiho ; Chung, Yong-Chae

  • Author_Institution
    Dept. of Ceramic Eng., Hanyang Univ., Seoul, South Korea
  • fYear
    2005
  • fDate
    25-28 Oct. 2005
  • Firstpage
    190
  • Lastpage
    191
  • Abstract
    In this study, the atomistic behaviors of surface diffusion and incorporation in Fe-Al multilayer systems were quantitatively investigated using density functional theory (DFT) calculation. The energy barrier, energy gain, charge density distribution, and density of states (DOS) were analyzed, in detail, to determine the factors governing the interface morphology and the growth mode for multilayer fabrication of extremely reduced dimension.
  • Keywords
    aluminium; density functional theory; interface states; iron; multilayers; surface diffusion; surface morphology; Al/Fe [001] systems; Fe-Al; Fe/Al(001) systems; atomic diffusion; atomistic behaviors; charge density distribution; density functional theory; electronic characteristics; energy barrier; energy gain; interface morphology; multilayer fabrication; states density; structural characteristics; surface diffusion; Aluminum alloys; Atomic layer deposition; Bonding; Bridges; Energy barrier; Iron alloys; Magnetic multilayers; Nickel alloys; Substrates; Surface morphology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 2005 International
  • Print_ISBN
    4-9902472-2-1
  • Type

    conf

  • DOI
    10.1109/IMNC.2005.203802
  • Filename
    1595278