• DocumentCode
    3271921
  • Title

    An Automation System for High-Speed Detection of Printed Matter and Defect Recognition

  • Author

    Ou, Yang ; Tao, Hu ; Xuan, Guo ; Baoping, Guo

  • Author_Institution
    Huazhong Univ. of Sci. & Technol., Wuhan
  • fYear
    2007
  • fDate
    20-24 March 2007
  • Firstpage
    213
  • Lastpage
    217
  • Abstract
    An automation system for high-speed detection of printed matter and defect recognition is proposed to detect defects in printed matter, such as smudges, doctor streaks, pin holes, character misprints, foreign matters, hazing, and wrinkles, etc. Any tiny defect would be developed by using the high and low illumination angles design and anti-blooming techniques. A new image reference method bused on morphological preprocessing eliminates all false defects brought by slight distortion of printed matter and chromatography mistake. The fast objects searching algorithm based on run-length-encoding can locate the coordinates of defects and define the shape of the defects. The C/S parallel network structure was used, image data were processed distributed and quality data is managed centralized. Experimental results verify the speed, reliability and accuracy of proposed system.
  • Keywords
    automatic optical inspection; printing industry; production engineering computing; quality management; reliability; C/S parallel network structure; antiblooming technique; character misprints; chromatography mistake; defect recognition; defects detection; doctor streaks; fast objects searching algorithm; foreign matters; hazing; illumination angles design; image reference method; pin holes; printed matter; run-length-encoding; smudges; wrinkles; Automation; Cameras; Charge-coupled image sensors; Fluorescence; Image processing; Inspection; Light sources; Lighting; Optical reflection; Printing; Image processing; defect of detection; gray morphology; machine vision; printed matter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integration Technology, 2007. ICIT '07. IEEE International Conference on
  • Conference_Location
    Shenzhen
  • Print_ISBN
    1-4244-1092-4
  • Electronic_ISBN
    1-4244-1092-4
  • Type

    conf

  • DOI
    10.1109/ICITECHNOLOGY.2007.4290463
  • Filename
    4290463