• DocumentCode
    3272732
  • Title

    Exploiting application-dependent ambient temperature for accurate architectural simulation

  • Author

    Jang, Hyung Beom ; Choi, Jinhang ; Yoon, Ikroh ; Lim, Sung-Soo ; Shin, Seungwon ; Chang, Naehyuck ; Chung, Sung Woo

  • Author_Institution
    Div. of Comput. & Commun. Eng., Korea Univ., Seoul, South Korea
  • fYear
    2010
  • fDate
    3-6 Oct. 2010
  • Firstpage
    502
  • Lastpage
    508
  • Abstract
    In the early stage of processor design, Dynamic Thermal Management (DTM) schemes should be evaluated to avoid excessively high temperature, while minimizing performance overhead as small as possible. In this paper, we show that conventional thermal simulations using fixed ambient temperature may lead to wrong conclusion in terms of performance and temperature; though ambient temperature converges to a steady state after hundreds of seconds, the steady state ambient temperature is significantly different depending on applications. To overcome the inaccuracy of conventional thermal simulations, we propose that architectural thermal simulation should exploit application-dependent ambient temperature. Our evaluation results show that the performance of the same DTM scheme is different, when application-dependent ambient temperature (compared to fixed temperature) is used. For accurate simulation, future architectural thermal researchers are expected to evaluate their proposed DTM schemes, reflecting application- dependent ambient temperature.
  • Keywords
    performance evaluation; thermal management (packaging); application-dependent ambient temperature; architectural simulation; architectural thermal simulation; dynamic thermal management; performance overhead; processor design; steady state ambient temperature; Computational modeling; Heat sinks; Portable computers; Temperature measurement; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design (ICCD), 2010 IEEE International Conference on
  • Conference_Location
    Amsterdam
  • ISSN
    1063-6404
  • Print_ISBN
    978-1-4244-8936-7
  • Type

    conf

  • DOI
    10.1109/ICCD.2010.5647639
  • Filename
    5647639