DocumentCode
3273226
Title
Effective WIP dependent lot release policies: A discrete event simulation approach
Author
Akhavan-Tabatabaei, Raha ; Salazar, Carlos F Ruiz
Author_Institution
Univ. de los Andes, Bogota, Colombia
fYear
2011
fDate
11-14 Dec. 2011
Firstpage
1971
Lastpage
1980
Abstract
In this paper we explore a lot release policy for wafer fabs that is based on the WIP threshold of the bottleneck station. Our results show that this policy is effective in cycle time improvement while keeping the same level of throughput compared with a case where no policy is applied. The application of this policy is practical and needs less considerations compared to policies that aim at keeping the WIP constant throughout the fab.
Keywords
discrete event simulation; semiconductor device manufacture; WIP threshold; cycle time improvement; discrete event simulation; lot release policy; wafer fabs; Discrete event simulation; Distance measurement; Lithography; Throughput; Time measurement; Workstations;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation Conference (WSC), Proceedings of the 2011 Winter
Conference_Location
Phoenix, AZ
ISSN
0891-7736
Print_ISBN
978-1-4577-2108-3
Electronic_ISBN
0891-7736
Type
conf
DOI
10.1109/WSC.2011.6147911
Filename
6147911
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