DocumentCode
3273252
Title
Visible electroluminescence (630 nm) from direct bandgap GaInP quantum dots grown on transparent GaP substrates
Author
Lee, Jong-Won ; Schremer, A.T. ; Shealy, J.R. ; Ballantyne, J.M.
Author_Institution
Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
Volume
2
fYear
1997
fDate
10-13 Nov 1997
Firstpage
529
Abstract
Not much progress has been made with optoelectronic devices on GaP and Si substrates owing to the lack of light emitting materials that can be epitaxially grown on these substrates with a low defect density. All currently available light emitting semiconductor compounds have lattice constants different from GaP and Si lattice constants, and therefore no thin films of useful thicknesses can be grown defect-free. Recently a new technique of embedding pockets of strained material into a host matrix without dislocating the crystal lattice has received much attention: strain-induced self-assembled quantum dots. Indeed, InAs/GaAs quantum dots have been successfully used as the active region of semiconductor laser devices with excellent device characteristics. We used a similar approach to induce formation of light-emitting GaInP quantum dots on GaP substrates. In this presentation, we report fabrication of light-emitting diodes (LEDs) with GalnP quantum dots as the active region
Keywords
III-V semiconductors; electroluminescence; gallium compounds; indium compounds; light emitting diodes; semiconductor quantum dots; 630 nm; GaInP-GaP; LED; direct bandgap GaInP quantum dot; epitaxial growth; fabrication; light emitting material; optoelectronic device; semiconductor compound; strain-induced self-assembly; transparent GaP substrate; visible electroluminescence; Crystalline materials; Electroluminescence; Lattices; Light emitting diodes; Optoelectronic devices; Photonic band gap; Quantum dot lasers; Semiconductor materials; Semiconductor thin films; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society Annual Meeting, 1997. LEOS '97 10th Annual Meeting. Conference Proceedings., IEEE
Conference_Location
San Francisco, CA
ISSN
1092-8081
Print_ISBN
0-7803-3895-2
Type
conf
DOI
10.1109/LEOS.1997.645553
Filename
645553
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