• DocumentCode
    3274112
  • Title

    Sign-bit based architecture for OFDM Acquisition for multiple-standards

  • Author

    Diaz, Isael ; Wilhelmsson, Leif ; Rodrigues, Joachim ; Olsson, Thomas ; Öwall, Viktor

  • Author_Institution
    Dept. of Electr. & Inf. Technol., Lund Univ., Lund, Sweden
  • fYear
    2009
  • fDate
    16-17 Nov. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents a hardware mapping of an auto-correlator for Orthogonal Frequency Division Multiplexing stage for three radio standards: LTE, DVB-H, and IEEE 802.11n. Hardware cost is minimized by using only the sign bit in the autocorrelation function. The frequency offset estimation procedure is dramatically simplified by reducing the phase of the envelope to ¿/2 resolution, which in turn reduces the need of specialized components. The architecture is synthesized towards a 65 nm low-leakage high threshold standard cell CMOS library. The 1-bit architecture reports an area reduction of 90% for memories, 56% for the logic and a power dissipation reduction of 35%, when compared to an identical 8-bit implementation. The approximate area occupied by the architecture is 0.03 mm2. Power simulations for IEEE 802.11n packet reports a power dissipation of 42 ¿W.
  • Keywords
    IEEE standards; OFDM modulation; VLSI; correlators; frequency estimation; telecommunication standards; wireless LAN; DVB-H; IEEE 802.11n; LTE; OFDM acquisition; autocorrelation function; frequency offset estimation procedure; multiple standards; orthogonal frequency division multiplexing; power 42 muW; sign bit architecture; size 0.03 mm; size 65 nm; threshold standard cell CMOS library; Autocorrelation; CMOS logic circuits; Cost function; Digital video broadcasting; Frequency estimation; Hardware; Libraries; OFDM; Phase estimation; Power dissipation; Acquisition; DVB-H; LTE; OFDM; Synchronization; VLSI; WLAN; multi-standard;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    NORCHIP, 2009
  • Conference_Location
    Trondheim
  • Print_ISBN
    978-1-4244-4310-9
  • Electronic_ISBN
    978-1-4244-4311-6
  • Type

    conf

  • DOI
    10.1109/NORCHP.2009.5397841
  • Filename
    5397841