• DocumentCode
    3274145
  • Title

    A generalized Epstein test method for the computation of core losses in induction motors

  • Author

    Tôrres, André G. ; Filho, Braz J Cardoso

  • Author_Institution
    CPDEE, Univ. Fed. de Minas Gerais, Belo Horizonte, Brazil
  • Volume
    2
  • fYear
    2002
  • fDate
    5-8 Nov. 2002
  • Firstpage
    1150
  • Abstract
    Modeling and definition of procedures leading to good estimation of core losses in induction motors from material test data is still a challenge. Complex geometry of the laminations, concentration of current in discrete number of slots and PWM inverter supply further increase the complexity of induction motor core losses model. In this paper, it is proposed an alternative for the modeling and computation of the stator core losses in induction motors based on lab tests of samples of the magnetic material with simple geometry. The proposed method accounts for effects such as flux space harmonics, PWM inverter supply, material anisotropy and cutting stress during the manufacturing process. Models, test methods and practical results from a 2 hp, 220 V, 4 pole, high efficiency three-phase induction motor, employing E-170 steel, are presented and discussed in detail.
  • Keywords
    PWM invertors; cutting; harmonic analysis; induction motor drives; laminations; losses; magnetic anisotropy; magnetic cores; magnetic materials; steel; variable speed drives; 2 hp; 220 V; E-170 steel; PWM inverter; PWM inverter supply; core losses; core losses computation; cutting stress; flux space harmonics; generalized Epstein test method; high efficiency three-phase induction motor; induction motor core losses model; induction motors; laminations; magnetic material; manufacturing process; material anisotropy; material test data; slots; stator core losses; Computational modeling; Core loss; Geometry; Induction motors; Lamination; Magnetic materials; Materials testing; Pulse width modulation inverters; Solid modeling; Stator cores;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IECON 02 [Industrial Electronics Society, IEEE 2002 28th Annual Conference of the]
  • Print_ISBN
    0-7803-7474-6
  • Type

    conf

  • DOI
    10.1109/IECON.2002.1185435
  • Filename
    1185435