• DocumentCode
    3275244
  • Title

    Electromigration Avoidance Aware Net Splitting Algorithm in Analog Circuits

  • Author

    Xue, Bing ; He, Xiangqing

  • Author_Institution
    Inst. of Microelectron. CAD, Tsinghua Univ., Beijing
  • Volume
    4
  • fYear
    2006
  • fDate
    25-28 June 2006
  • Firstpage
    2805
  • Lastpage
    2808
  • Abstract
    Electromigration caused by insufficient wire width can result in the unwanted failure of a circuit. Different from digital circuits, analog circuits may have a multitude of different current levels. It is therefore an important issue to concern about current densities in routing procedure for analog circuits, especially in the net splitting step. In this paper, we present a fast terminal tree construction algorithm taking current into account and apply simulated annealing approach to net area minimization. Experimental results show that compared with previous algorithms, our algorithm gives much smaller areas of multi-terminal nets.
  • Keywords
    analogue circuits; current density; electromigration; failure analysis; network routing; simulated annealing; analog circuits; circuit failure; current density; electromigration avoidance aware net splitting algorithm; fast terminal tree construction algorithm; multiterminal nets; net area minimization; routing procedure; simulated annealing approach; Aluminum; Analog circuits; Current density; Digital circuits; Electromigration; Grain boundaries; Minimization methods; Routing; Simulated annealing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, Circuits and Systems Proceedings, 2006 International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    0-7803-9584-0
  • Electronic_ISBN
    0-7803-9585-9
  • Type

    conf

  • DOI
    10.1109/ICCCAS.2006.285250
  • Filename
    4064497