• DocumentCode
    3275816
  • Title

    Multirange fractal approach to analyze the microstructure of Sn melt

  • Author

    Zhou, Yongzhi ; Geng, Haoran ; Li, Mei ; Yang, Zhongxi ; Wang, Zhiming

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Univ. of Jinan, Jinan, China
  • Volume
    7
  • fYear
    2010
  • fDate
    16-18 Oct. 2010
  • Firstpage
    3147
  • Lastpage
    3151
  • Abstract
    Based on results of X-ray diffraction experiment, multirange fractal approach has been used to discuss the discontinuous microstructure changes of Sn melt. Partially-overlapping multirange fractal structure is observed, and as temperature decreases from 900°C to 240°C, low fractal dimension reveals discontinuous changes from 2.8682 to 2.4192, which can divide the cooling process into three regions. Nevertheless, high fractal dimension is still 3.000 without alteration. Multirange fractal characteristics of Sn melt were correlated with the evolution of microstructure. The discussion was made in detail. Multirange fractal model was proposed to calculate transition curves of multirange fractals by utilizing relevant low dimensional fractals and high dimensional fractals of Sn melt at different temperatures. The results show that values of simulation show good agreement with experimental values, the maximum error ranges from 0.09% to 0.89%. From the analysis, the range of the transition region between two fractal regions is speculated to be related with the properties of metal melts. In addition, ultrafine particle and its aggregation mechanism were used to analyze the fractal morphologies.
  • Keywords
    X-ray diffraction; aggregation; crystal microstructure; fractals; liquid metals; tin; Sn; Sn melt; X-ray diffraction; XRD; aggregation mechanism; cooling process; discontinuous microstructure changes; fractal morphologies; fractal regions; high dimensional fractals; high fractal dimension; low dimensional fractals; low fractal dimension; maximum error; metal melts; microstructure evolution; multirange fractal approach; multirange fractal characteristics; multirange fractal model; partially-overlapping multirange fractal structure; temperature 240 degC to 900 degC; transition curves; transition region; ultrafine particle; Atomic measurements; Fractals; Mathematical model; Temperature; Tin; X-ray diffraction; X-ray diffraction; metal melt; microstructure change; multirange fractal approach;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image and Signal Processing (CISP), 2010 3rd International Congress on
  • Conference_Location
    Yantai
  • Print_ISBN
    978-1-4244-6513-2
  • Type

    conf

  • DOI
    10.1109/CISP.2010.5647793
  • Filename
    5647793