• DocumentCode
    3277175
  • Title

    Improving the accuracy of thin film dielectric characterization using the Kalman filter

  • Author

    Kohl, Paul A. ; Bidstrup-Allen, S.A.

  • fYear
    1996
  • fDate
    28-30 Oct 1996
  • Firstpage
    77
  • Lastpage
    79
  • Abstract
    Using an inverse method known as the Kalman filter on microstrip resonance measurements, calculations of dielectric constant and loss tangent can be improved compared to other methods and error bars better constrained
  • Keywords
    Kalman filters; dielectric loss measurement; dielectric thin films; inverse problems; microstrip filters; microwave measurement; permittivity measurement; Kalman filter; dielectric constant; error bars; inverse method; loss tangent; microstrip resonance measurement; thin film dielectric;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 1996., IEEE 5th Topical Meeting
  • Conference_Location
    Napa, CA
  • Print_ISBN
    0-7803-3514-7
  • Type

    conf

  • DOI
    10.1109/EPEP.1996.564786
  • Filename
    564786
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3277175