DocumentCode
3277773
Title
Comparator testing in a flash A/D converter
Author
Onete, Cristian E.
Author_Institution
NXP Semicond., Eindhoven, Netherlands
fYear
2009
fDate
9-11 Sept. 2009
Firstpage
165
Lastpage
168
Abstract
In this paper, a method of testing a flash A/D converter is presented. The flash A/D is first reconfigured as a propagation type A/D and it is tested afterwards. It is shown that the testing method is suitable for a fully automated use i.e. without the need of external devices.
Keywords
analogue-digital conversion; comparators (circuits); logic circuits; logic testing; comparator testing; external devices; flash A-D converter; propagation type A/D; Automatic testing; Circuit testing; Decoding; Error correction; Matrix converters; Semiconductor device testing; Signal generators; Signal resolution; Switches; Switching converters;
fLanguage
English
Publisher
ieee
Conference_Titel
SOC Conference, 2009. SOCC 2009. IEEE International
Conference_Location
Belfast
Print_ISBN
978-1-4244-4940-8
Electronic_ISBN
978-1-4244-4941-5
Type
conf
DOI
10.1109/SOCCON.2009.5398068
Filename
5398068
Link To Document