• DocumentCode
    3279830
  • Title

    Analysis of remnant field detected by hall sensors above superconductor tape

  • Author

    Thakur, Kailash P. ; Badcock, R.A. ; Long, N.J. ; Hamilton, K.A.

  • Author_Institution
    Ind. Res. Ltd., Lower Hutt, New Zealand
  • fYear
    2009
  • fDate
    25-28 Oct. 2009
  • Firstpage
    244
  • Lastpage
    247
  • Abstract
    This paper describes various approaches to the analysis of the remnant field arising from the current distribution in superconductor tape. This is of use as a quality control technique when it is important that the superconducting tape has a homogenous current distribution across its width. Superconducting tape is exposed to a magnetic field perpendicular to its surface, inducing currents within the tape. The magnetic field produced by these induced currents can then be measured to assess the distribution of the currents. This paper discusses three techniques to analyze the remnant field in superconducting tape viz. (i) analytic inversion of the Biot-Savart law (ii) computation of the local perpendicular field gradient across the tape and (iii) a least squares fit of the measured magnetic field data to a critical state model. Defects are detected as disruptions to the current distribution calculated for a uniform superconductor. Gradient computation offers a quick way to compare the quality of the samples.
  • Keywords
    Hall effect transducers; current distribution; superconducting tapes; Biot-Savart law; Hall sensors; critical state model; gradient computation; homogenous current distribution; induced currents; least squares fit; local perpendicular field gradient; magnetic field; quality control technique; remnant field; superconducting tape; superconductor tape; Current distribution; High temperature superconductors; Magnetic analysis; Magnetic field measurement; Magnetic sensors; SQUIDs; Sensor arrays; Sensor systems; Superconducting films; Superconducting magnets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2009 IEEE
  • Conference_Location
    Christchurch
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-4548-6
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2009.5398175
  • Filename
    5398175