• DocumentCode
    3280537
  • Title

    Effects of Eccentricity to Performance of M-ary Elliptical Phase Shift Keying (M=4,8)

  • Author

    Song, Chunyi ; Shimamoto, Shigeru

  • Author_Institution
    Waseda Univ., Tokyo
  • fYear
    2008
  • fDate
    March 31 2008-April 3 2008
  • Firstpage
    1945
  • Lastpage
    1949
  • Abstract
    M-ary Elliptical Phase Shift Keying (M-EPSK) have been proposed and evaluated through simulations in our previous works. According to the simulation results, M-EPSK (M=4,8) can achieve better noise performance than MPSK; in particular, M-EPSK can adaptively realize trade-offs between bandwidth efficiency and power efficiency by varying the eccentricity. Eccentricity is the main modulation variable that makes M-EPSK distinctive comparing with conventional MPSK. Substantial effects of eccentricity to performance of M-EPSK have been verified in simulations; however, prior to exploring applications of M-EPSK in communication systems, principle behind the effects of eccentricity to performance needs to be further studied. In this paper, we theoretically evaluate effects of eccentricity to decision parameters of performance, and then explore a novel solution based on approximate treatment to derive closed-form BER approximations of M-EPSK over an AWGN channel. In the BER approximations, the effects of eccentricity to both error performance and bandwidth efficiency of M-EPSK are mathematically derived. In addition, the theoretical results agree with simulation results.
  • Keywords
    AWGN channels; bandwidth allocation; error statistics; phase shift keying; AWGN channel; BER approximations; M-ary elliptical phase shift keying; bandwidth efficiency; eccentricity; AWGN channels; Additive white noise; Bandwidth; Bit error rate; Communications Society; Constellation diagram; Frequency; Gaussian noise; Phase shift keying; Signal analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wireless Communications and Networking Conference, 2008. WCNC 2008. IEEE
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1525-3511
  • Print_ISBN
    978-1-4244-1997-5
  • Type

    conf

  • DOI
    10.1109/WCNC.2008.346
  • Filename
    4489377