DocumentCode
3282386
Title
Degradation of Characteristics and Critical Bit-Flip Errors in Cascaded 3-Stage CMOS Inverters due to RF Interference
Author
Kim, Kyechong ; Iliadis, Agis A.
fYear
2005
fDate
Dec. 7-9, 2005
Firstpage
5
Lastpage
6
Keywords
Degradation; Digital systems; Electromagnetic interference; Frequency; Inverters; Power dissipation; Probes; RF signals; Radiofrequency interference; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Device Research Symposium, 2005 International
Print_ISBN
1-4244-0083-X
Type
conf
DOI
10.1109/ISDRS.2005.1595948
Filename
1595948
Link To Document