• DocumentCode
    3284005
  • Title

    Magnetic Properties of Atomic-Layer-Deposited Hafnium Dioxide

  • Author

    Chen, H.-Y. ; Ye, P.D. ; Murray, J. ; Xiong, P. ; von Molnar, S. ; Wilk, G.D.

  • fYear
    2005
  • fDate
    Dec. 7-9, 2005
  • Firstpage
    217
  • Lastpage
    218
  • Keywords
    Crystallization; Hafnium oxide; Magnetic field measurement; Magnetic films; Magnetic materials; Magnetic properties; Magnetosphere; Rapid thermal annealing; Temperature dependence; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2005 International
  • Print_ISBN
    1-4244-0083-X
  • Type

    conf

  • DOI
    10.1109/ISDRS.2005.1596060
  • Filename
    1596060