DocumentCode

3284055

Title

Topase-A tool for studying reliabilityof substrations

Author

Renault, I. ; Bulot, M. ; Bourgade, E. ; Desmas, T.

Author_Institution

Electricite de France

Volume

2

fYear

1993

fDate

5-8 Sep 1993

Firstpage

634

Lastpage

639

Keywords

Circuit faults; Data acquisition; Probability; Testing; Timing; Transfer functions;

fLanguage

English

Publisher

ieee

Conference_Titel

Athens Power Tech, 1993. APT 93. Proceedings. Joint International Power Conference

Type

conf

DOI

10.1109/APT.1993.673875

Filename

673875