• DocumentCode
    3285036
  • Title

    Growth of sprayed nanostructured copper (I) iodide (CuI) thin films at different precursor solution concentration

  • Author

    Amalina, M.N. ; Rusop, M.

  • Author_Institution
    NANO-Electron. Centre (NET), Univ. Teknol. MARA (UiTM), Shah Alam, Malaysia
  • fYear
    2011
  • fDate
    19-20 Dec. 2011
  • Firstpage
    339
  • Lastpage
    342
  • Abstract
    In this research, the effect of precursor concentration of CuI thin film deposited by spraying technique was studied. The CuI concentration varies from 0.05 M to 0.5 M. The CuI solution was prepared by mixing the CuI powder with 50 ml of acetonitrile as a solvent. The deposition takes 15 min for 50 ml at a constant temperature of 50°C. The result shows the CuI thin film properties strongly depends on its precursor concentration. The structural properties were characterized by XRD with strong (111) orientation shows for all the CuI thin films. The Urbach energy as calculated from transmittance spectra increased up to 0.1 M. The electrical properties indicates the decreased of conductivity as the concentration increased.
  • Keywords
    X-ray diffraction; copper compounds; electrical conductivity; mixing; nanofabrication; nanoparticles; semiconductor growth; semiconductor thin films; spraying; CuI; Urbach energy; X-ray diffraction; XRD; acetonitrile solvent; electrical conductivity; electrical properties; mixing; nanostructured copper iodide thin films; p-type semiconductor material; powder; precursor solution concentration; spraying; structural properties; temperature 50 degC; time 15 min; transmittance spectra; Conductivity; Current measurement; Optical films; Spraying; Substrates; X-ray scattering; CuI thin films; Electrical properties; Optical properties; Solution Concentration; Spraying;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Research and Development (SCOReD), 2011 IEEE Student Conference on
  • Conference_Location
    Cyberjaya
  • Print_ISBN
    978-1-4673-0099-5
  • Type

    conf

  • DOI
    10.1109/SCOReD.2011.6148761
  • Filename
    6148761