DocumentCode
3286157
Title
Modeling of MEMS reliability in shock environments
Author
Fang, Xu-Wen ; Huang, Qing-An ; Tang, Jie-ying
Author_Institution
Minist. of Educ. Key Lab. of MEMS, Southeast Univ., Nanjing, China
Volume
2
fYear
2004
fDate
18-21 Oct. 2004
Firstpage
860
Abstract
To determine the reliability of MEMS devices in shock environments, in this paper, we present a method that can be used to formulate the responses of microcantilever under shock loads by taking it as a distributed-parameter system. The displacements and stresses of microcantilever are formulated with the mode superposition method. The failure modes may be estimated by the maximum displacement and stress. This method can be also used in other complicated MEMS structures and devices, therefore the reliability designs of MEMS can be improved greatly.
Keywords
micromechanical devices; reliability; MEMS reliability; distributed-parameter system; failure modes; microcantilever displacement; microeantilever stress; mode superposition method; shock environments; Commercialization; Electric shock; Fabrication; Microelectromechanical devices; Micromechanical devices; Microstructure; Packaging; Predictive models; Reliability engineering; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
Print_ISBN
0-7803-8511-X
Type
conf
DOI
10.1109/ICSICT.2004.1436643
Filename
1436643
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