• DocumentCode
    3286157
  • Title

    Modeling of MEMS reliability in shock environments

  • Author

    Fang, Xu-Wen ; Huang, Qing-An ; Tang, Jie-ying

  • Author_Institution
    Minist. of Educ. Key Lab. of MEMS, Southeast Univ., Nanjing, China
  • Volume
    2
  • fYear
    2004
  • fDate
    18-21 Oct. 2004
  • Firstpage
    860
  • Abstract
    To determine the reliability of MEMS devices in shock environments, in this paper, we present a method that can be used to formulate the responses of microcantilever under shock loads by taking it as a distributed-parameter system. The displacements and stresses of microcantilever are formulated with the mode superposition method. The failure modes may be estimated by the maximum displacement and stress. This method can be also used in other complicated MEMS structures and devices, therefore the reliability designs of MEMS can be improved greatly.
  • Keywords
    micromechanical devices; reliability; MEMS reliability; distributed-parameter system; failure modes; microcantilever displacement; microeantilever stress; mode superposition method; shock environments; Commercialization; Electric shock; Fabrication; Microelectromechanical devices; Micromechanical devices; Microstructure; Packaging; Predictive models; Reliability engineering; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
  • Print_ISBN
    0-7803-8511-X
  • Type

    conf

  • DOI
    10.1109/ICSICT.2004.1436643
  • Filename
    1436643