DocumentCode
3287297
Title
Thermal analysis and optimization of 2.5-D integrated voltage regulator
Author
Taigon Song ; Sturcken, Noah ; Athikulwongse, Krit ; Shepard, Kenneth ; Sung Kyu Lim
Author_Institution
Dept. of ECE, Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2012
fDate
21-24 Oct. 2012
Firstpage
25
Lastpage
28
Abstract
Integrated voltage regulators (IVRs) promise to improve performance-per-watt for microprocessors and systems-on-chip by reducing supply voltage margins, resistive losses in the power distribution network, and by enabling power management with greater temporal resolution. However, the thermal impact of IVRs has not been well studied, and the methodologies for thermal analysis of analog/digital mixed-signal designs, such as voltage regulators on chip, have not yet been developed. In this paper, we present a thermal analysis methodology for 2.5-D IVR. Our results show that (1) the integrated power inductor is the hottest component in the IVR, and (2) the temperature of the IVR rises rapidly when the power inductor and the circuitries of the IVR chip overlap. In order to address these issues, we propose two design optimization techniques: design block relocation and inductor spreading. Related experiments show the effectiveness of these methods.
Keywords
system-on-chip; thermal management (packaging); voltage regulators; 2.5-D integrated voltage regulator; IVR chip overlap; analog-digital mixed-signal design; design block relocation; inductor spreading; integrated power inductor; microprocessor; power distribution network; power management; resistive losses; supply voltage margin; systems-on-chip; temporal resolution; thermal analysis; thermal impact; Heating; Inductors; Integrated circuits; Regulators; Silicon; Thermal analysis; Voltage control; Analog; Integrated Voltage Regulator; Mixed System; Silicon Interposer; Thermal Analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on
Conference_Location
Tempe, AZ
Print_ISBN
978-1-4673-2539-4
Electronic_ISBN
978-1-4673-2537-0
Type
conf
DOI
10.1109/EPEPS.2012.6457835
Filename
6457835
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