• DocumentCode
    3287359
  • Title

    Gas ambient dependence of quality factor in MEMS resonators

  • Author

    Li, Q. ; Goosen, J.F.L. ; van Keulen, F. ; van Beek, J.T.M.

  • Author_Institution
    Mater. Innovation Inst., Delft, Netherlands
  • fYear
    2009
  • fDate
    25-28 Oct. 2009
  • Firstpage
    1040
  • Lastpage
    1043
  • Abstract
    In this paper, the gas dependence of the Q factor in MEMS resonators is investigated and verified by the measurements in different ambient gases, with pressures changing from vacuum to atmosphere. The experimental results agree favorably with the existing theoretical models. The findings in the work suggest that low molecular weight gasses can be used to enhance the Q factor without the need for external low pressure.
  • Keywords
    Q-factor; micromechanical resonators; MEMS resonators; gas ambient dependence; low molecular weight gasses; quality factor; Atmospheric measurements; Damping; Gases; Micromechanical devices; Packaging; Q factor; Q measurement; Resonance; Technological innovation; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2009 IEEE
  • Conference_Location
    Christchurch
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-4548-6
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2009.5398588
  • Filename
    5398588