• DocumentCode
    3287683
  • Title

    Role of interfaces in nanostructured CoFe2O4 films

  • Author

    Axelsson, Anna-Karin ; Aguesse, Frederic ; Alford, Neil McN. ; Valant, Matjaz

  • Author_Institution
    Dept. of Mater., Imperial Coll. London, London, UK
  • fYear
    2012
  • fDate
    9-13 July 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In bulk ceramics, interfaces between adjacent materials can be neglected when evaluating the individual functional properties on the macroscale. However, in nanostructured materials, a region described as an interfacial region can comprise up to 10% of the total volume. By traditional XRD and SEM these regions may be hard to describe. Here we present how a combination of non destructive material analysis and property analysis brings knowledge of the chemistry at the interfaces and microstructure in the film. Epitaxial thin film CoFe2O4 were grown on several growth templates such as SrTiO3, LaAlO3, BaTiO3 and MgO as to vary the interfacial region and subsequent growth mechanism. The chemical stability and crystallographic matching between the magnetic film and the dielectric growth template are discussed where dramatic changes of the functional properties of these nanoscale structures demonstrate that the interfaces have a deleterious effect on the properties.
  • Keywords
    X-ray diffraction; atomic force microscopy; ceramics; cobalt compounds; ferrites; interface magnetism; magnetic epitaxial layers; nanomagnetics; nanostructured materials; nondestructive testing; surface chemistry; CoFe2O4; SEM; XRD; bulk ceramics; chemical stability; crystallographic matching; deleterious effect; dielectric growth template; epitaxial thin film; functional properties; interfacial chemistry; magnetic film; microstructure; nanoscale structures; nanostructured films; nanostructured materials; nondestructive material analysis; property anaysis; total volume; Epitaxial growth; Magnetic domains; Magnetic films; Magnetic properties; Strain; Substrates; AFM; CoFe2O4; MFM; growth mechanism; interfaces; thin film;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp
  • Conference_Location
    Aveiro
  • Print_ISBN
    978-1-4673-2668-1
  • Type

    conf

  • DOI
    10.1109/ISAF.2012.6297866
  • Filename
    6297866