DocumentCode
3287683
Title
Role of interfaces in nanostructured CoFe2 O4 films
Author
Axelsson, Anna-Karin ; Aguesse, Frederic ; Alford, Neil McN. ; Valant, Matjaz
Author_Institution
Dept. of Mater., Imperial Coll. London, London, UK
fYear
2012
fDate
9-13 July 2012
Firstpage
1
Lastpage
4
Abstract
In bulk ceramics, interfaces between adjacent materials can be neglected when evaluating the individual functional properties on the macroscale. However, in nanostructured materials, a region described as an interfacial region can comprise up to 10% of the total volume. By traditional XRD and SEM these regions may be hard to describe. Here we present how a combination of non destructive material analysis and property analysis brings knowledge of the chemistry at the interfaces and microstructure in the film. Epitaxial thin film CoFe2O4 were grown on several growth templates such as SrTiO3, LaAlO3, BaTiO3 and MgO as to vary the interfacial region and subsequent growth mechanism. The chemical stability and crystallographic matching between the magnetic film and the dielectric growth template are discussed where dramatic changes of the functional properties of these nanoscale structures demonstrate that the interfaces have a deleterious effect on the properties.
Keywords
X-ray diffraction; atomic force microscopy; ceramics; cobalt compounds; ferrites; interface magnetism; magnetic epitaxial layers; nanomagnetics; nanostructured materials; nondestructive testing; surface chemistry; CoFe2O4; SEM; XRD; bulk ceramics; chemical stability; crystallographic matching; deleterious effect; dielectric growth template; epitaxial thin film; functional properties; interfacial chemistry; magnetic film; microstructure; nanoscale structures; nanostructured films; nanostructured materials; nondestructive material analysis; property anaysis; total volume; Epitaxial growth; Magnetic domains; Magnetic films; Magnetic properties; Strain; Substrates; AFM; CoFe2 O4 ; MFM; growth mechanism; interfaces; thin film;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp
Conference_Location
Aveiro
Print_ISBN
978-1-4673-2668-1
Type
conf
DOI
10.1109/ISAF.2012.6297866
Filename
6297866
Link To Document