• DocumentCode
    3288850
  • Title

    Modeling of tunneling current at field emission display tips: for non-metallic tips and an analytic method of solving for electric fields

  • Author

    Lee, Byoungho ; Min, Sung-Wook ; Bang, Ji-Hoon ; Hwang, Do-Sung ; Kwon, Taek-Jung

  • Author_Institution
    Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
  • fYear
    1996
  • fDate
    7-12 Jul 1996
  • Firstpage
    97
  • Lastpage
    101
  • Abstract
    Schwarz-Christoffel conformal mapping is applied to calculate electric fields in field emission display tips for various tip radii and tip-to-tip distances. This method is much faster than numerical analysis methods. Tunneling currents from silicon tips are calculated including a band structure and band-bending. Wigner transport analysis is also suggested as a tunneling current prediction method for field emission display tips
  • Keywords
    display devices; electric fields; electron field emission; tunnelling; vacuum microelectronics; Schwarz-Christoffel conformal mapping; Si; Wigner transport; band bending; band structure; electric field; field emission display; nonmetallic tip; tunneling current; Conformal mapping; Electrons; Finite element methods; Flat panel displays; Maxwell equations; Numerical analysis; Prediction methods; Quantum mechanics; Silicon; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Microelectronics Conference, 1996. IVMC'96., 9th International
  • Conference_Location
    St. Petersburg
  • Print_ISBN
    0-7803-3594-5
  • Type

    conf

  • DOI
    10.1109/IVMC.1996.601782
  • Filename
    601782