DocumentCode
3288850
Title
Modeling of tunneling current at field emission display tips: for non-metallic tips and an analytic method of solving for electric fields
Author
Lee, Byoungho ; Min, Sung-Wook ; Bang, Ji-Hoon ; Hwang, Do-Sung ; Kwon, Taek-Jung
Author_Institution
Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
fYear
1996
fDate
7-12 Jul 1996
Firstpage
97
Lastpage
101
Abstract
Schwarz-Christoffel conformal mapping is applied to calculate electric fields in field emission display tips for various tip radii and tip-to-tip distances. This method is much faster than numerical analysis methods. Tunneling currents from silicon tips are calculated including a band structure and band-bending. Wigner transport analysis is also suggested as a tunneling current prediction method for field emission display tips
Keywords
display devices; electric fields; electron field emission; tunnelling; vacuum microelectronics; Schwarz-Christoffel conformal mapping; Si; Wigner transport; band bending; band structure; electric field; field emission display; nonmetallic tip; tunneling current; Conformal mapping; Electrons; Finite element methods; Flat panel displays; Maxwell equations; Numerical analysis; Prediction methods; Quantum mechanics; Silicon; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Microelectronics Conference, 1996. IVMC'96., 9th International
Conference_Location
St. Petersburg
Print_ISBN
0-7803-3594-5
Type
conf
DOI
10.1109/IVMC.1996.601782
Filename
601782
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