Multi-bit DAC with noise-shaped element mismatch

Author

Lin, Haiqing ; Silva, Jose Barreiro da ; Zhang, Bo ; Schreier, Richard

Author_Institution

Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA

Volume

1

fYear

1996

fDate

12-15 May 1996

Firstpage

235

Abstract

By a process similar to delta-sigma modulation, the noise caused by static mismatch in a multi-level unit-element DAC can be attenuated in a narrow frequency band. This paper explores the circuit considerations for switched-current and switched-capacitor realizations of the unit-element DAC. The switched-current DAC is found to be relatively simple and capable of high-speed operation. The switched-capacitor circuit is more complex and likely to be somewhat slower, but it is nonetheless robust and provides a simple interface. A dynamic range of 110 dB with a third-order 17-level DAC is expected, even if the DAC elements suffer from 1% mismatch

Keywords

circuit noise; digital-analogue conversion; switched capacitor networks; switched current circuits; SC type; SI type; high-speed operation; multi-bit DAC; multilevel unit-element DAC; noise-shaped element mismatch; static mismatch; switched-capacitor realizations; switched-current realizations; Buildings; Circuit noise; Delta modulation; Delta-sigma modulation; Frequency; Linearity; Logic; Multi-stage noise shaping; Quantization; Switching circuits;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1996. ISCAS '96., Connecting the World., 1996 IEEE International Symposium on

Conference_Location

Atlanta, GA

Print_ISBN

0-7803-3073-0

Type

conf

DOI

10.1109/ISCAS.1996.539872

Filename

539872