• DocumentCode
    3289275
  • Title

    The emergence of high volume copper ball bonding

  • Author

    Deley, Michael ; Levine, Lee, Sr.

  • Author_Institution
    Ball Bonder Marketing, Kulicke & Soffa Industries Inc., Willow Grove, PA, USA
  • fYear
    2004
  • fDate
    July 14-16, 2004
  • Firstpage
    186
  • Lastpage
    190
  • Abstract
    Copper ball bonding has emerged as a high-volume semiconductor assembly process. It already is well established in the high-power, low-pin count market segment. In addition to having better properties than gold, copper provides higher electrical and thermal conductivity, higher strength and stiffness, and better intermetallic reliability than comparable gold ball bonds. As these benefits are demonstrated, it migrates into higher I/O, more demanding, fine pitch product lines. Cost savings achievable with copper ball bonding are substantial and represent a major cost improvement for our highly competitive industry.
  • Keywords
    copper; electrical conductivity; integrated circuit bonding; integrated circuit economics; integrated circuit packaging; thermal conductivity; Cu; electrical conductivity; fine pitch product; gold ball bonds; high volume copper ball bonding; high-volume semiconductor assembly process; intermetallic reliability; low-pin count market; stiffness properties; strength properties; thermal conductivity; Bonding; Copper; Costs; Electronics packaging; Gold; Metals industry; Semiconductor device manufacture; Strontium; Thermal conductivity; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 2004. IEEE/CPMT/SEMI 29th International
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-8582-9
  • Type

    conf

  • DOI
    10.1109/IEMT.2004.1321658
  • Filename
    1321658